Laser FIB: Industrial Applications, June 2016

The laser assisted focused ion beam (Laser FIB) has been developed by the EPSRC Centre for Innovative Manufacturing in Ultra Precision to enable ultra precision featuring in the 10’s of nanometre range, over relatively large substrates, over the 10’s of millimetre scales.  This platform will enable new economies of scale for products that currently have struggled to progress beyond academia or small scale manufacturing.

The event, held on 23 June 2016 at the Institute for Manufacturing (IfM), University of Cambridge,  where the platform is being developed, examined the applications this new platform can address for manufacturing up-scale and look to new innovations that will now be possible utilising the unique hybrid processing machine.

Speakers at the event were from across academia and industrial sectors and participants were able to view facilities on the day at the IfM through a series of laboratory tours.


Prof Xichun Luo, University of Strathclyde
Dr Rene Dobbe, FEI
Prof Bill O'Neill, University of Cambridge
Event speakers, left to right: Prof Xichun Luo, University of Strathclyde, Dr Rene Dobbe, FEI, Dr Fabian Perez-Willard, Carl Zeiss Microscopy GmbH, Prof Bill O'Neill, University of Cambridge, Dr Saurav Goel, University of Cambridge, Prof Paul Warburton, University College London, Martin O'Hara, Cranfield University and Dr Xu Fang, University of Southampton.